Date: Wednesday 1 October 2008, 14:00-15:00
Venue: EM G19-20
Name: Dr. Mike Petter, Loughborough Surface Analysis Ltd
I will explain briefly how a selection of these methods work and illustrate the techniques with real-world examples drawn from the semiconductor and electronics sectors. The techniques I propose to cover will include SIMS, Auger and XPS. The talk is intended as a general introduction to surface analytical and depth profiling techniques and would be of interest to anyone who has a need to control or measure the composition of surfaces, thin films or buried interfaces.